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課程名稱 |
掃描探針顯微術:基礎原理, 應用與實作
Scanning probe microscopy: Fundamental, Application, and Practice |
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開課學期 |
108-2 |
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授課對象 |
理學院 物理學研究所 |
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授課教師 |
白偉武 |
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課號 |
Phys8131 |
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課程識別碼 |
222 D3450 |
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班次 |
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學分 |
2.0 |
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全/半年 |
半年 |
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必/選修 |
選修 |
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上課時間 |
星期四7,8(14:20~16:20) |
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上課地點 |
新物517 |
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備註 |
總人數上限：30人 |
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Ceiba 課程網頁 |
http://ceiba.ntu.edu.tw/1082Phys8131_ |
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課程簡介影片 |
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核心能力關聯 |
本課程尚未建立核心能力關連 |
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課程大綱
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課程概述 |
The course will introduce modern scanning probe microscopy (SPM) techniques, mainly scanning tunneling microscopy (STM) and atomic force microscopy (AFM). First, the principle of STM and AFM is discussed in details. Fundamental measurement methods and modes of operations in STM and AFM are then introduced. Selected examples in SPM applications in contemporary scientific and industrial research will be given. Advanced SPM techniques will be broadly covered and students are expected to participate in this part of discussion through oral presentation and literature survey. This course contains mandatory hand-on laboratory experiments, which can be either AFM or STM. |
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課程目標 |
Upon completing this course, the student should be able to describe the basic physical and technical aspects of STM and AFM. For example, to describe quantum mechanical theory for tunneling in scanning tunneling microscopy (STM) and Tersoff-Hermann interpretation of LDOS. Or, to describe various forces acting in standard AFM modes. The student will know basic technical aspects of an SPM instrument and its limits. The student should be able to describe several examples and uses of SPM in various research fields and industries. Finally, the student should be able to operate an SPM instrument and obtain meaningful measurement independently. |
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課程要求 |
Intended for students from 3rd year undergraduates to graduate students in physics and other science fields. This course will be taught partly in English and partly in Chinese. |
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預期每週課後學習時數 |
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Office Hours |
備註： One hour immediately after each class |
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指定閱讀 |
待補 |
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參考書目 |
Scanning Probe Microscopy: The Lab on a Tip, 2004 Edition, by Ernst Meyer, Hans J. Hug, Roland Bennewitz, ISBN-13: 978-3540431800
Introduction to Scanning Tunneling Microscopy: Second Edition, by C. Julian Chen, , ISBN-13: 9780199211500 |
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評量方式
(僅供參考) |
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No. |
項目 |
百分比 |
說明 |
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1. |
oral presentations |
50% |
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2. |
laboratory and reports |
50% |
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